MCL-E-770G(LH)
该材料适用于PoP, CSP构造的半导体封装基板。
项目 | 条件 | 单位 | MCL-E-770G(LH) | MCL-E-770G | |
---|---|---|---|---|---|
玻璃态转化温度(Tg) | TMA | ℃ | 260~280 | 260~280 | |
热膨胀系数 | X,Y | α1 | ppm/℃ | 1.5~2.0 | 4~6 |
α2 | 0~1.0 | 1~2 | |||
Z | α1 | 8~13 | 13~18 | ||
α2 | 70~90 | 90~110 | |||
弯曲模量 | A | GPa | 34~36 | 30~32 | |
半加成制程积层耐热性 | 260℃reflow | cycle | >20 | >20 | |
相对介电常数(Dk) | 1GHz※1 | - | 3.9~4.1 | 4.1~4.3 | |
介电损耗角正切(Df) | 1GHz※1 | - | 0.004~0.006 | 0.004~0.006 |
※1 Measured by Triplate-Line Resonator
* Package size:14×14mm
* Chip size:7.3×7.3mm
* Chip thickness:150μm
* Underfill thickness:60μm
* Solder Resist:20μm
* Core Thickness:200μm+
PPG1024(S-glass)
<Measurement Conditions>
/ Method:Triplate-line resonator by vector network analyzer(IPC-TM-650_2.5.5.5)
/ Temperature&Humidity:25℃/50%RH
/ Laminate thickness:1.6mm(signal-ground distance:800μm), copper foil:18μm
/ Signal conductor line width:1mm(Zo:approx.50Ω)
适用于半导体封装基板、积层内层芯材等